Search results for: Steve Knebel
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 324 - 330
Nano Energy > 2017 > 36 > C > 381-389
2016 IEEE International Electron Devices Meeting (IEDM) > 11.6.1 - 11.6.4
Solid-State Electronics > 2016 > 115 > PB > 133-139
IEEE Electron Device Letters > 2015 > 36 > 5 > 430 - 432
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1278 - 1283
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 154 - 160
Thin Solid Films > 2013 > 533 > Complete > 88-92
IEEE Transactions on Electron Devices > 2013 > 60 > 7 > 2368 - 2371