Search results for: Kevin J. Nowka
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 12 > 1657 - 1665
Journal of Electronic Testing > 2008 > 24 > 1-3 > 129-141
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 12 > 1657 - 1665
Journal of Electronic Testing > 2008 > 24 > 1-3 > 129-141