Search results for: Stephane Lefebvre
IEEE Electron Device Letters > 2017 > 38 > 10 > 1453 - 1456
Microelectronics Reliability > 2015 > 55 > 9-10 > 1708-1713
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 4 > 483 - 495
Microelectronics Reliability > 2014 > 54 > 9-10 > 1845-1850
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2359 - 2366
IEEE Transactions on Industrial Electronics > 2011 > 58 > 10 > 4931 - 4941
Microelectronics Reliability > 2009 > 49 > 9-11 > 1358-1362