Search results for: S. Karboyan
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-4-1 - 4A-4-5
2015 IEEE International Electron Devices Meeting (IEDM) > 35.2.1 - 35.2.4
Microelectronics Reliability > 2013 > 53 > 9-11 > 1491-1495
Microelectronics Reliability > 2012 > 52 > 9-10 > 2184-2187