Search results for: G. Meneghesso
Microelectronics Reliability > 2018 > 80 > C > 257-265
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3734 - 3739
Microelectronics Reliability > 2017 > 76-77 > C > 556-560
Microelectronics Reliability > 2017 > 76-77 > C > 626-630
Microelectronics Reliability > 2017 > 76-77 > C > 298-303
Microelectronics Reliability > 2017 > 76-77 > C > 584-587
Microelectronics Reliability > 2017 > 76-77 > C > 575-578
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3126 - 3131
Solar Energy Materials and Solar Cells > 2017 > 168 > C > 51-61
Solid-State Electronics > 2017 > 132 > C > 49-56
2017 IEEE International Reliability Physics Symposium (IRPS) > PA-1.1 - PA-1.5
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 73 - 77
Microelectronics Reliability > 2016 > 64 > C > 623-626
Microelectronics Reliability > 2016 > 64 > C > 610-613
Microelectronic Engineering > 2016 > 160 > C > 63-67
physica status solidi c > 13 > 5‐6 > 321 - 324
2016 IEEE International Reliability Physics Symposium (IRPS) > PV-2-1 - PV-2-5