Search results for: Hans Reisinger
2017 IEEE International Reliability Physics Symposium (IRPS) > 2E-4.1 - 2E-4.8
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-2.1 - 2D-2.7
Microelectronics Reliability > 2016 > 64 > C > 179-184
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2730 - 2737
Microelectronics Reliability > 2014 > 54 > 9-10 > 2310-2314
2014 IEEE International Reliability Physics Symposium > XT.18.1 - XT.18.5
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3586 - 3593
2012 IEEE International Reliability Physics Symposium (IRPS) > 2F.4.1 - 2F.4.6
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.11.1 - XT.11.6
2011 International Reliability Physics Symposium > 6A.1.1 - 6A.1.8
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 3652 - 3666