Search results for: J. Urresti-Ibanez
IEEE Transactions on Industrial Electronics > 2011 > 58 > 7 > 2706 - 2714
Microelectronics Reliability > 2008 > 48 > 8-9 > 1427-1431
Microelectronics Reliability > 2007 > 47 > 9-11 > 1725-1729
IEEE Transactions on Industrial Electronics > 2011 > 58 > 7 > 2706 - 2714
Microelectronics Reliability > 2008 > 48 > 8-9 > 1427-1431
Microelectronics Reliability > 2007 > 47 > 9-11 > 1725-1729