Search results for: X. Jorda
IEEE Electron Device Letters > 2017 > 38 > 4 > 505 - 508
IEEE Transactions on Industrial Electronics > 2015 > 62 > 12 > 7774 - 7785
Microelectronics Reliability > 2014 > 54 > 9-10 > 2207-2212
Microelectronics Reliability > 2014 > 54 > 9-10 > 1839-1844
Microelectronics Reliability > 2013 > 53 > 8 > 1084-1094
Microelectronics Reliability > 2013 > 53 > 8 > 1076-1083
CAS 2012 (International Semiconductor Conference) > 2 > 359 - 362
Microelectronics Reliability > 2012 > 52 > 9-10 > 2294-2300
Microelectronics Reliability > 2012 > 52 > 9-10 > 2314-2320
Microelectronics Reliability > 2012 > 52 > 9-10 > 2250-2255
Microelectronics Reliability > 2012 > 52 > 9-10 > 2471-2476