Search results for: Farid N. Najm
2017 IEEE International Reliability Physics Symposium (IRPS) > 6B-5.1 - 6B-5.10
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 11 > 1914 - 1927
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 2 > 729 - 742
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 3 > 489 - 502
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 9 > 1509 - 1522
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2012 > 31 > 4 > 472 - 484