Search results for: B Rouzeyre
Microelectronics Reliability > 2014 > 54 > 9-10 > 2289-2294
Microelectronics Reliability > 2013 > 53 > 9-11 > 1320-1324
Microelectronics Reliability > 2012 > 52 > 9-10 > 1781-1786
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 2 > 329 - 333
Journal of Electronic Testing > 2009 > 25 > 4-5 > 269-278