Search results for: A Fantini
2016 IEEE International Electron Devices Meeting (IEDM) > 4.6.1 - 4.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 7.5.1 - 7.5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.3.1 - 5E.3.7
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4540 - 4546