Search results for: Neng Chen
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 914 - 920
IEEE Electron Device Letters > 2013 > 34 > 12 > 1551 - 1553
IEEE Electron Device Letters > 2012 > 33 > 7 > 1048 - 1050
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 209 - 216
IEEE Electron Device Letters > 2011 > 32 > 8 > 1119 - 1121
Journal of Electronic Materials > 2001 > 30 > 4 > 331-335