Search results for: L. Larcher
2010 International Electron Devices Meeting > 19.6.1 - 19.6.4
Microelectronics Reliability > 2010 > 50 > 9-11 > 1251-1258
IEEE Electron Device Letters > 2010 > 31 > 9 > 1032 - 1034
Microelectronics Journal > 2009 > 40 > 9 > 1337-1344
IEEE Electron Device Letters > 2009 > 30 > 8 > 882 - 884
IEEE Electron Device Letters > 2009 > 30 > 6 > 653 - 655