Search results for: J. Wurfl
Solid-State Electronics > 2016 > 125 > C > 118-124
Microelectronics Reliability > 2016 > 64 > C > 556-559
IEEE Electron Device Letters > 2016 > 37 > 4 > 385 - 388
Microelectronics Reliability > 2016 > 58 > C > 177-184
Microelectronics Reliability > 2014 > 54 > 9-10 > 2191-2195
2013 IEEE International Electron Devices Meeting > 6.1.1 - 6.1.4
2013 IEEE International Reliability Physics Symposium (IRPS) > CD.3.1 - CD.3.7
physica status solidi c > 8 > 7‐8 > 2207 - 2209
Microelectronics Reliability > 2011 > 51 > 2 > 217-223
Microelectronics Reliability > 2010 > 50 > 6 > 763-766
IEEE Electron Device Letters > 2009 > 30 > 9 > 901 - 903