Search results for: A. Herkersdorf
Microelectronics Reliability > 2016 > 61 > C > 11-16
2009 46th ACM/IEEE Design Automation Conference > 220 - 225
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 10 > 1335 - 1345
Microelectronics Reliability > 2016 > 61 > C > 11-16
2009 46th ACM/IEEE Design Automation Conference > 220 - 225
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 10 > 1335 - 1345