Search results for: Philipp Hehenberger
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 3652 - 3666
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 526 - 535
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 3652 - 3666
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 526 - 535