Search results for: U. Kerst
Microelectronics Reliability > 2014 > 54 > 9-10 > 1794-1797
2013 IEEE International Reliability Physics Symposium (IRPS) > CD.3.1 - CD.3.7
Journal of Contemporary Physics (Armenian Academy of Sciences) > 2011 > 46 > 5 > 218-225
Journal of Materials Science: Materials in Electronics > 2011 > 22 > 10 > 1553-1579
Microelectronics Reliability > 2010 > 50 > 9-11 > 1441-1445
Microelectronics Reliability > 2010 > 50 > 9-11 > 1899-1902
Microelectronics Reliability > 2009 > 49 > 9-11 > 1158-1164
IEEE Design & Test of Computers > 2008 > 25 > 3 > 250 - 257
Microelectronics Reliability > 2007 > 47 > 9-11 > 1523-1528
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 19 - 30
Microelectronics Reliability > 2006 > 46 > 9-11 > 1498-1503