Search results for: R. Schlangen
Microelectronics Reliability > 2010 > 50 > 9-11 > 1454-1458
Microelectronics Reliability > 2009 > 49 > 9-11 > 1158-1164
IEEE Design & Test of Computers > 2008 > 25 > 3 > 250 - 257
Microelectronics Reliability > 2007 > 47 > 9-11 > 1523-1528
Microelectronics Reliability > 2006 > 46 > 9-11 > 1498-1503
Microelectronics Reliability > 2005 > 45 > 9-11 > 1544-1549