Search results for: V. Paraschiv
2007 IEEE International Electron Devices Meeting > 329 - 332
Microelectronic Engineering > 2007 > 84 > 9-10 > 1865-1868
Microelectronic Engineering > 2006 > 83 > 10 > 2027-2031
Solid State Electronics > 2006 > 50 > 7-8 > 1227-1234
Microelectronics Reliability > 2005 > 45 > 5-6 > 1007-1011
European Polymer Journal > 1997 > 33 > 8 > 1251-1254