Search results for: L.-A. Ragnarsson
2013 IEEE International Reliability Physics Symposium (IRPS) > GD.3.1 - GD.3.5
Microelectronics Reliability > 2012 > 52 > 9-10 > 1932-1935
2012 IEEE International Reliability Physics Symposium (IRPS) > 5A.4.1 - 5A.4.6
2011 International Electron Devices Meeting > 28.6.1 - 28.6.4
2011 International Electron Devices Meeting > 18.5.1 - 18.5.4
Microelectronic Engineering > 2011 > 88 > 7 > 1317-1322
2010 International Electron Devices Meeting > 10.6.1 - 10.6.4
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4
Solid State Electronics > 2010 > 54 > 9 > 855-860
2010 IEEE International Reliability Physics Symposium > 1095 - 1098