Search results for: J.A. Maestro
Microelectronics Reliability > 2017 > 72 > C > 85-89
Microelectronics Reliability > 2016 > 63 > C > 314-318
Electronics Letters > 2015 > 51 > 1 > 50 - 52
Computer Communications > 2014 > 50 > Complete > 110-118
Electronics Letters > 2014 > 50 > 22 > 1602 - 1604
Microelectronics Reliability > 2014 > 54 > 1 > 335-337
Microelectronics Reliability > 2014 > 54 > 1 > 338-340
Electronics Letters > 2013 > 49 > 25 > 1617 - 1618
Optical Switching and Networking > 2011 > 8 > 3 > 131-138
Microelectronics Reliability > 2011 > 51 > 6 > 1152-1156
Microelectronics Reliability > 2011 > 51 > 3 > 703-710
Integration, the VLSI Journal > 2009 > 42 > 2 > 128-136
IEEE Communications Letters > 2009 > 13 > 9 > 697 - 699
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2091 - 2102
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 403 - 411