Search results for: G. Groeseneken
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3414 - 3420
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3432 - 3441
IEEE Electron Device Letters > 2007 > 28 > 3 > 242 - 244