Search results for: Zhaoji Li
Microelectronics Reliability > 2012 > 52 > 4 > 692-697
Solid State Electronics > 2012 > 69 > Complete > 89-93
IEEE Transactions on Electron Devices > 2012 > 59 > 2 > 504 - 509
IEEE Electron Device Letters > 2012 > 33 > 10 > 1438 - 1440
IEEE Electron Device Letters > 2012 > 33 > 5 > 703 - 705
IEEE Electron Device Letters > 2012 > 33 > 12 > 1684 - 1686
IEEE Electron Device Letters > 2012 > 33 > 3 > 417 - 419
Microelectronics Journal > 2011 > 42 > 2 > 415-421