Search results for: J.L. Cazaux
Microelectronics Reliability > 2013 > 53 > 9-11 > 1659-1662
Microelectronics Reliability > 2012 > 52 > 9-10 > 2310-2313
2009 IEEE MTT-S International Microwave Symposium Digest > 1001 - 1004
2006 European Microwave Conference > 807 - 810
2006 European Microwave Conference > 1068 - 1071
2006 European Microwave Conference > 890 - 893
Microelectronics Reliability > 2006 > 46 > 9-11 > 1741-1746
2006 IEEE MTT-S International Microwave Symposium Digest > 1784 - 1787
Microelectronics Reliability > 2005 > 45 > 9-11 > 1770-1775