Search results for: Paul E. Dodd
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2965 - 2971
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4512 - 4519
IEEE Transactions on Nuclear Science > 2013 > 60 > 3-2 > 2101 - 2118
IEEE Transactions on Nuclear Science > 2013 > 60 > 3-2 > 1836 - 1851
IEEE Transactions on Nuclear Science > 2013 > 60 > 3-2 > 2074 - 2100
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2968 - 2975
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2695 - 2701
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2591 - 2598
IEEE Transactions on Nuclear Science > 2010 > 57 > 5-3 > 2948 - 2954
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1777 - 1780
IEEE Transactions on Nuclear Science > 2006 > 53 > 6-1 > 3132 - 3138
IEEE Transactions on Nuclear Science > 2006 > 53 > 6-1 > 3187 - 3194
Microelectronics Reliability > 2000 > 40 > 1 > 17-26