Search results for: C. Bailey
Microelectronics Reliability > 2017 > 68 > C > 77-85
2010 IEEE CPMT Symposium Japan > 1 - 4
IEEE Nanotechnology Magazine > 2009 > 3 > 2 > 34 - 37
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 1 > 40 - 48