Search results for: S. Pravossoudovitch
Journal of Electronic Testing > 2016 > 32 > 2 > 147-161
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3389 - 3394
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1747 - 1754
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1663 - 1670
Journal of Electronic Testing > 2012 > 28 > 2 > 215-228
2011 Sixteenth IEEE European Test Symposium > 153 - 158