Search results for: T. Roggenbauer
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 69 - 73
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 3 > 386 - 392
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 69 - 73
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 3 > 386 - 392