Search results for: E.P. Gusev
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 190 - 202
Microelectronic Engineering > 2007 > 84 > 9-10 > 2158-2164
Thin Solid Films > 2007 > 515 > 13 > 5308-5313
Nuclear Inst. and Methods in Physics Research, B > 2006 > 249 > 1-2 > 517-522
Microelectronic Engineering > 2005 > 80 > Complete > 58-61
Microelectronics Reliability > 2005 > 45 > 5-6 > 783-785
Microelectronic Engineering > 2004 > 72 > 1-4 > 273-277
Microelectronic Engineering > 2004 > 72 > 1-4 > 50-54
Microelectronic Engineering > 2003 > 69 > 2-4 > 145-151
Microelectronic Engineering > 2001 > 59 > 1-4 > 341-349
Microelectronic Engineering > 1997 > 36 > 1-4 > 29-32
Surface Science > 1996 > 351 > 1-3 > 111-128
Surface Science > 1996 > 352-354 > 21-24
Applied Surface Science > 1996 > 104-105 > 329-334