Wyniki wyszukiwania dla: V. Kudina
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Diagnostics of the SOI Devices > 287-306
Microelectronics Reliability > 2013 > 53 > 3 > 394-399
Solid State Electronics > 2011 > 63 > 1 > 27-36
Solid State Electronics > 2009 > 53 > 6 > 613-620
Solid State Electronics > 2008 > 52 > 5 > 801-807