Search results for: N. Lukyanchikova
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > Characterization and Simulation of SOI Devices Operating under Harsh Environment > 255-260
NATO Science Series II: Mathematics, Physics and Chemistry > Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices > Noise in Nanoscale Devices > 129-136
NATO Science for Peace and Security Series B: Physics and Biophysics > Nanoscaled Semiconductor-on-Insulator Structures and Devices > Reliability and Characterization of Nanoscaled SOI Devices > 181-198
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Diagnostics of the SOI Devices > 287-306
Microelectronics Reliability > 2013 > 53 > 3 > 394-399
Solid State Electronics > 2011 > 63 > 1 > 27-36
Solid State Electronics > 2010 > 54 > 2 > 178-184
Solid State Electronics > 2009 > 53 > 6 > 613-620
Solid State Electronics > 2008 > 52 > 5 > 801-807
Solid State Electronics > 2007 > 51 > 1 > 16-37
Materials Science in Semiconductor Processing > 2006 > 9 > 4-5 > 727-731
Solid State Electronics > 2006 > 50 > 1 > 52-57
Solid State Electronics > 2004 > 48 > 5 > 747-758
Journal of Materials Science: Materials in Electronics > 2001 > 12 > 4-6 > 207-210
Microelectronics Reliability > 1998 > 38 > 10 > 1561-1568