Search results for: Chang Yong Kang
IEEE Electron Device Letters > 2013 > 34 > 2 > 196 - 198
IEEE Electron Device Letters > 2012 > 33 > 11 > 1517 - 1519
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 3021 - 3026
2011 International Reliability Physics Symposium > 5A.4.1 - 5A.4.5
2011 International Reliability Physics Symposium > XT.1.1 - XT.1.5
IEEE Electron Device Letters > 2011 > 32 > 11 > 1474 - 1476
IEEE Electron Device Letters > 2011 > 32 > 5 > 686 - 688
IEEE Electron Device Letters > 2011 > 32 > 12 > 1668 - 1670
IEEE Electron Device Letters > 2010 > 31 > 10 > 1104 - 1106
IEEE Electron Device Letters > 2009 > 30 > 12 > 1365 - 1367
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 171 - 179
IEEE Electron Device Letters > 2009 > 30 > 7 > 760 - 762
IEEE Electron Device Letters > 2009 > 30 > 3 > 298 - 301
IEEE Electron Device Letters > 2008 > 29 > 4 > 389 - 391