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This work focuses on volume diagnosis for identifying systematic faults in lower-yield wafers, whose yields are lower than baseline level due to systematic faults during mass production. We develop a model-based volume diagnosis method. To diagnose accurately using the fail data with one lower-yield wafer, we apply modeling techniques for handling pseudo-faults and random faults in the fail data....
To identify and quantify active Fe species in the selective catalytic reduction (SCR) of NO by NH 3 , a series of Fe/ZSM-5 catalysts was prepared by impregnation, reductive solid-state ion exchange, and chemical vapor deposition (CVD) under different levels of Fe loading, and was characterized by XRD, temperature-programmed desorption (TPD) of NH 3 and NO 2 , and UV–vis, Mössbauer,...
A model of NO x selective reduction by hydrocarbon (HC) was developed, which takes into account the adsorption and desorption of HC. The model was applied for predicting the performance of a De–NO x catalytic reactor, working under transient conditions such as a legislative driving cycle. Diesel fuel was used as a supplemental reductant. The behavior of HC and NO x reactions...
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