Search results for: T. Kim
Electronics Letters > 2012 > 48 > 1 > 45 - 47
2011 International SoC Design Conference > 163 - 166
2011 International SoC Design Conference > 412 - 415
2011 IEEE Nuclear Science Symposium Conference Record > 3422 - 3425
2011 International Reliability Physics Symposium > EM.2.1 - EM.2.6
IET Computers & Digital Techniques > 2011 > 5 > 2 > 113 - 122