Search results for: R. Rodríguez
Microelectronic Engineering > 2017 > 178 > C > 289-292
Microelectronics Reliability > 2014 > 54 > 8 > 1500-1510
Analog Integrated Circuits and Signal Processing > 2014 > 78 > 1 > 65-76
2013 IEEE International Reliability Physics Symposium (IRPS) > ER.2.1 - ER.2.6
Microelectronic Engineering > 2013 > 103 > Complete > 144-149
2013 Spanish Conference on Electron Devices > 281 - 284
Microelectronic Engineering > 2011 > 88 > 7 > 1384-1387
Integration, the VLSI Journal > 2009 > 42 > 3 > 286-293
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 2155 - 2159
Microelectronic Engineering > 2007 > 84 > 5-8 > 1618-1621
Microelectronic Engineering > 2007 > 84 > 1 > 31-36