Search results for: Takeo Hattori
Microelectronic Engineering > 2013 > 109 > Complete > 197-199
IEEE Transactions on Electron Devices > 2012 > 59 > 2 > 269 - 276
IEEE Electron Device Letters > 2012 > 33 > 3 > 423 - 425
Microelectronics Reliability > 2008 > 48 > 11-12 > 1769-1771
Journal of Alloys and Compounds > 2006 > 417 > 1-2 > 187-189
Thin Solid Films > 2006 > 508 > 1-2 > 103-106
Journal of Alloys and Compounds > 2005 > 389 > 1-2 > 229-233
Journal of Alloys and Compounds > 2004 > 377 > 1-2 > 167-173
Materials Science in Semiconductor Processing > 2004 > 7 > 4-6 > 389-392
Journal of Alloys and Compounds > 2001 > 327 > 1-2 > 121-126
Journal of Alloys and Compounds > 2000 > 311 > 2 > 153-158
Journal of Alloys and Compounds > 2000 > 305 > 1-2 > 130-135
Applied Surface Science > 2000 > 162-163 > 62-68
Applied Surface Science > 1998 > 123-124 > Complete > 87-90
Applied Surface Science > 1997 > 117-118 > 119-122