Search results for: A. Alam
2016 IEEE International Electron Devices Meeting (IEDM) > 15.7.1 - 15.7.4
IEEE Electron Device Letters > 2016 > 37 > 6 > 801 - 804
2013 IEEE International Electron Devices Meeting > 7.5.1 - 7.5.4
2011 International Reliability Physics Symposium > 4A.1.1 - 4A.1.11
2010 IEEE International Reliability Physics Symposium > 1069 - 1072
2010 IEEE International Reliability Physics Symposium > 1091 - 1094