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The worldwide first 100MHz dynamic oxide semiconductor RAM (DOSRAM) is successfully demonstrated using a new high-mobility crystalline In-Ga-Zn-O (IGZO) material. The new IGZO exhibits around two times carrier mobility of conventional IGZO, while still achieving an extremely low off-state leakage (Ioff) at ∼10−21A (zA) level. Attributed to DOSRAM performance improvement, 100MHz normally-off (Noff)...
The worldwide first 100MHz dynamic oxide semiconductor RAM (DOSRAM) is successfully demonstrated using a new high-mobility crystalline In-Ga-Zn-O (IGZO) material. The new IGZO exhibits around two times carrier mobility of conventional IGZO, while still achieving an extremely low off-state leakage (Ioff) at ∼10−21A (zA) level. Attributed to DOSRAM performance improvement, 100MHz normally-off (Noff)...
The demand of higher data-rates for mobile communication has driven the LTE standard to adopt methods to increase channel bandwidth by Carrier Aggregation (CA), this is known as LTE-Advanced (LTE-A). Due to regional spectrum allocation, these carriers can be inter-band, or intra-band with contiguous (CCA) or non-contiguous (NCCA) channels. The band combinations create a major challenge for an LTE-A...
This letter presents a low-power frequency quintupler fabricated through a TSMC 90 nm CMOS process. By forming a sub-harmonic mixer and a cross-coupled pair in a cascoded topology, the proposed circuit provided the five-time output frequency and consumed less dc power than a conventional circuit. The cross-coupled pair also enhanced the power level of the 4 harmonics so that the quintupler...
Traffic in wireless networks has become more diverse due to various applications running on smartphones. Moreover, traffic generated by background processes which has small amount of data and widely dispersed in time takes up a large portion of diverse data applications. To reduce signaling overhead due to frequent state transitions of radio resource control (RRC), the evolved nodeB (eNB) tends to...
A scheme that ATPG-based technique for reducing shift and capture power during scan testing is presented without any influence on fault coverage. This paper presents an X-filling approach called adjacent backtracing fill (AB-fill). After AB-fill approach for at-speed scan testing, all of test patterns have assigned as partially-specified values with a small number of don't care bits (x) as in test...
In this paper, we present a low power strategy for test data compression that is called ldquobreak-independent-table (BIT) encodingrdquo. In addition, we present a new decompression scheme for test vectors that is called ldquotest slice difference techniquerdquo to solve huge test data volume that must be stored in the tester memory. About how reducing power dissipation problem, we present an extremely...
A self-disable sensing technique for content-addressable memories (CAM) is presented in this work. The proposed differential match-line sense amplifier can be self disabled to choke the charge current fed into the match line right after the comparison result is generated. Instead of using typical NOR/NAND CAM cells with the single ended match-line, a novel NAND CAM cell with the differential match-line...
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