Search results for: Adolf Schöner
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 366 - 373
physica status solidi c > 9 > 7 > 1680 - 1682
Silicon Carbide > MOS Interfaces > 193 - 214
Silicon Carbide > JFET > 77 - 119
Microelectronics Reliability > 2006 > 46 > 5-6 > 743-755
Microelectronic Engineering > 2006 > 83 > 1 > 75-78
Materials Science & Engineering B > 1999 > 61-62 > Complete > 155-157