Search results for: A. Wymysłowski
Microelectronics Reliability > 2013 > 53 > 5 > 761-766
Microelectronics Reliability > 2012 > 52 > 7 > 1300-1305
Materials Science Poland > 2010 > Vol. 28, No. 3 > 655--662
Microelectronics Reliability > 2013 > 53 > 5 > 761-766
Microelectronics Reliability > 2012 > 52 > 7 > 1300-1305
Materials Science Poland > 2010 > Vol. 28, No. 3 > 655--662