Search results for: Yu-Sheng Chen
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4492 - 4495
2015 IEEE International Reliability Physics Symposium > MY.7.1 - MY.7.6
IEEE Electron Device Letters > 2014 > 35 > 2 > 202 - 204
IEEE Electron Device Letters > 2014 > 35 > 2 > 223 - 225
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.1.1 - 5E.1.7
IEEE Journal of Solid-State Circuits > 2013 > 48 > 3 > 878 - 891
IEEE Journal of Solid-State Circuits > 2012 > 47 > 6 > 1483 - 1496
IEEE Electron Device Letters > 2011 > 32 > 11 > 1585 - 1587
IEEE Design & Test of Computers > 2011 > 28 > 1 > 64 - 71
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2466 - 2472
IEEE Electron Device Letters > 2011 > 32 > 3 > 390 - 392
IEEE Electron Device Letters > 2010 > 31 > 12 > 1473 - 1475