Wyniki wyszukiwania dla: C. Wang
2016 IEEE International Electron Devices Meeting (IEDM) > 21.5.1 - 21.5.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 484 - 492
IEEE Transactions on Applied Superconductivity > 2012 > 22 > 3 > 9502204