Search results for: V. Delaye
2015 IEEE International Electron Devices Meeting (IEDM) > 17.2.1 - 17.2.4
Microsystem Technologies > 2015 > 21 > 5 > 973-977
2014 IEEE International Electron Devices Meeting > 6.5.1 - 6.5.4
2014 IEEE International Electron Devices Meeting > 22.4.1 - 22.4.4
Thin Solid Films > 2014 > 563 > Complete > 15-19
2013 IEEE International Electron Devices Meeting > 21.5.1 - 21.5.4
Solid State Electronics > 2013 > 84 > Complete > 46-52
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.8.1 - MY.8.5
Microsystem Technologies > 2013 > 19 > 5 > 647-653
2012 International Electron Devices Meeting > 18.7.1 - 18.7.4
2012 International Electron Devices Meeting > 31.5.1 - 31.5.4
Microelectronics Reliability > 2012 > 52 > 9-10 > 1928-1931