Search results for: Y. Nishimura
2016 IEEE International Electron Devices Meeting (IEDM) > 8.4.1 - 8.4.4
IEEE Transactions on Plasma Science > 2010 > 38 > 12-2 > 3442 - 3448
2016 IEEE International Electron Devices Meeting (IEDM) > 8.4.1 - 8.4.4
IEEE Transactions on Plasma Science > 2010 > 38 > 12-2 > 3442 - 3448