Search results for: He Yigang
Circuits, Systems, and Signal Processing > 2018 > 37 > 8 > 3227-3244
Journal of Electronic Testing > 2011 > 27 > 5 > 611-625
Circuits, Systems, and Signal Processing > 2008 > 27 > 5 > 683-698
Journal of Systems Engineering and Electronics > 2007 > 18 > 3 > 628-632
Analog Integrated Circuits and Signal Processing > 2007 > 52 > 1-2 > 47-55