Search results for: Y. Shi
Metrology and Measurement Systems > 2012 > Vol. 19, nr 4 > 817-830
Metrology and Measurement Systems > 2010 > Vol. 17, nr 3 > 349-361
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 61-75
Metrology and Measurement Systems > 2012 > Vol. 19, nr 4 > 817-830
Metrology and Measurement Systems > 2010 > Vol. 17, nr 3 > 349-361
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 61-75