Metrology and Measurement Systems > 2012 > Vol. 19, nr 4 > 817-830
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journal ISSN : | 0860-8229 |
journal e-ISSN : | 2300-1941 |
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Bibliography
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[1] Bandler, J.W. , Salama, A.E. (1985). Fault diagnosis of analog circuits. In Proc. IEEE, 73(8), 1279-1325.
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[2] Vock, S.R., Escalona, O.J., Turner, C, Owens, FJ. (2012). Challenges for Semiconductor Test Engineering. Journal of Electronic Testing, 28(3), 365-374.
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[3] Lin, P.M., Elcherif, Y.S. (1985). Analogue circuits fault dictionary - New approaches and implementation. Int. J. Circuit Theory Appl. , 13(2), 149-172.