Search results for: Yu Cao
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-5.1 - CR-5.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 6 > 987 - 996
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 4 > 666 - 670
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 2 > 173 - 183
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 1862 - 1872
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 10 > 1470 - 1480
IEEE Transactions on Semiconductor Manufacturing > 2009 > 22 > 1 > 196 - 203
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 509 - 517
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2002 > 10 > 6 > 799 - 805