Search results for: Anindya Sundar Dhar
Circuits, Systems, and Signal Processing > 2018 > 37 > 12 > 5595-5615
Journal of Signal Processing Systems > 2019 > 91 > 5 > 539-550
Circuits, Systems, and Signal Processing > 2018 > 37 > 11 > 5101-5126
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3057 - 3066
Microelectronics Journal > 2017 > 68 > C > 1-6
Journal of Signal Processing Systems > 2018 > 90 > 11 > 1569-1580
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2588 - 2601
Journal of Electronic Testing > 2017 > 33 > 4 > 529-537
IET Circuits, Devices & Systems > 2017 > 11 > 2 > 166 - 172
Microelectronics Reliability > 2016 > 63 > C > 291-303
Journal of Real-Time Image Processing > 2016 > 11 > 1 > 37-46
IET Circuits, Devices & Systems > 2015 > 9 > 3 > 152 - 160
Microelectronics Reliability > 2015 > 55 > 3-4 > 704-712