Search results for: B. Chen
2012 International Electron Devices Meeting > 20.6.1 - 20.6.4
2012 IEEE International Reliability Physics Symposium (IRPS) > MY.4.1 - MY.4.4
IEEE Electron Device Letters > 2011 > 32 > 1 > 93 - 95
IEEE Electron Device Letters > 2011 > 32 > 3 > 282 - 284